Published October 10, 2003
by Springer .
Written in English
|The Physical Object|
|Number of Pages||210|
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on 5/5(3). The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide Author: Roland Wiesendanger. This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the : Springer International Publishing.
Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. SICM allows for the determination of the surface topography of micrometer and even nanometer-range structures in aqueous media conducting electrolytes. The samples can be hard or soft, are generally non-conducting, and the non-destructive nature of the measurement allows.
This book provides the first comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanisms down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the. This work is a text-book for senior students, dedicated to one of the most modern technique in the field of surface science: the Scanning Probe Microscopy (SPM).Author: Victor Mironov. The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunnelling microscopy and related scanning probe techniques. This book aims to provide a clear and comprehensive introduction to this subject. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM).